JPS62197078U - - Google Patents

Info

Publication number
JPS62197078U
JPS62197078U JP1986084733U JP8473386U JPS62197078U JP S62197078 U JPS62197078 U JP S62197078U JP 1986084733 U JP1986084733 U JP 1986084733U JP 8473386 U JP8473386 U JP 8473386U JP S62197078 U JPS62197078 U JP S62197078U
Authority
JP
Japan
Prior art keywords
integrated circuit
socket base
gear
socket
utility
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1986084733U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1986084733U priority Critical patent/JPS62197078U/ja
Priority to US07/055,195 priority patent/US4812755A/en
Priority to CA000538801A priority patent/CA1266333A/en
Publication of JPS62197078U publication Critical patent/JPS62197078U/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Connecting Device With Holders (AREA)
JP1986084733U 1986-06-05 1986-06-05 Pending JPS62197078U (en])

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP1986084733U JPS62197078U (en]) 1986-06-05 1986-06-05
US07/055,195 US4812755A (en) 1986-06-05 1987-05-28 Base board for testing integrated circuits
CA000538801A CA1266333A (en) 1986-06-05 1987-06-04 Plug board with concentric grounding belt for testing integrated circuits

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1986084733U JPS62197078U (en]) 1986-06-05 1986-06-05

Publications (1)

Publication Number Publication Date
JPS62197078U true JPS62197078U (en]) 1987-12-15

Family

ID=13838895

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1986084733U Pending JPS62197078U (en]) 1986-06-05 1986-06-05

Country Status (3)

Country Link
US (1) US4812755A (en])
JP (1) JPS62197078U (en])
CA (1) CA1266333A (en])

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5132612A (en) * 1991-03-14 1992-07-21 The United States Of America As Represented By The Secretary Of The Air Force Apparatus for electrostatic discharge (ESD) stress/testing
FI99169C (fi) * 1991-09-16 1997-10-10 Picopak Oy Menetelmä puolijohdepiirin testauksessa käytettävän apuvälineen valmistamiseksi
US5410254A (en) * 1993-03-04 1995-04-25 Lsi Logic Corporation Method for optimizing the structure of a transistor to withstand electrostatic discharge
JP2836676B2 (ja) * 1996-02-09 1998-12-14 日本電気株式会社 半導体要素の試験方法及び装置
US5808852A (en) * 1996-05-30 1998-09-15 Emi Holding Corp. Chain mail ground for electromagnetic testing platform
KR100231649B1 (ko) * 1996-08-03 1999-11-15 윤종용 커패시터 충전회로를 갖는 검사용 기판 및 이를이용한 집적회로 검사 방법
WO2014067676A1 (en) * 2012-11-05 2014-05-08 Ismeca Semiconductor Holding Sa An assembly for testing the performance of a component

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3988049A (en) * 1973-09-12 1976-10-26 The United States Of America As Represented By The United States Energy Research And Development Administration Apparatus for high speed rotation of electrically operated devices
JPS5724869A (en) * 1980-07-22 1982-02-09 Nec Corp High voltage pulse applicator
US4677375A (en) * 1985-06-14 1987-06-30 Hanwa Electronic Co., Ltd. Apparatus for testing integrated circuit

Also Published As

Publication number Publication date
CA1266333A (en) 1990-02-27
US4812755A (en) 1989-03-14

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